@inproceedings{inproceedings, title = {{TEM analysis of Si-passivated Ge-on-Si MOSFET structures for high performance PMOS device technology}}, url = {{}}, year = {{2010}}, month = {{1}}, author = {{Norris DJ and Ross IM and Cullis AG and Walther T and Myronov M and Dobbie A and Whall T and Parker EHC and Leadley DR and De Jaeger B and Lee W et al}}, doi = {{10.1088/1742-6596/241/1/012044}}, volume = {{241}}, journal = {{Journal of Physics: Conference Series}}, note = {{Accessed on 2025/03/16}}}