@inproceedings{inproceedings, title = {{TEM analysis of Si-passivated Ge-on-Si MOSFET structures for high performance PMOS device technology}},
url = {{}},
year = {{2010}},
month = {{1}},
author = {{Norris DJ and Ross IM and Cullis AG and Walther T and Myronov M and Dobbie A and Whall T and Parker EHC and Leadley DR and De Jaeger B and Lee W et al}},
doi = {{10.1088/1742-6596/241/1/012044}},
volume = {{241}},
journal = {{Journal of Physics: Conference Series}},
note = {{Accessed on 2025/03/16}}}