TY - CHAP T1 - Application of a U-Net Convolutional Neural Network to Ultrasonic Wavefield Measurements for Defect Characterization T2 - Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 PY - 2021/04/26 AU - Eckels JD AU - Fernandez IF AU - Ho K AU - Dervilis N AU - Jacobson EM AU - Wachtor AJ ED - DO - DOI: 10.1007/978-3-030-76335-0_18 PB - Springer International Publishing SP - 167 EP - 181 Y2 - 2025/03/16 ER -